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Foundations of Measurement Volume II : Geometrical, Threshold, and Probabilistic Representations Volume 2

Foundations of Measurement Volume II : Geometrical, Threshold, and Probabilistic Representations Volume 2

PAPERBACK

15 Dec, 2006

All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurem...

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ISBN-10:

0486453154

ISBN-13:

9780486453156

Publisher

Dover Publications

Dimensions

8.46 X 6.34 X 1.05 inches

Language

English

Description

All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.

Product Details

ISBN-10

:0486453154

ISBN-13

:9780486453156

Publisher

:Dover Publications

Publication date

: 15 Dec, 2006

Category

: Mathematics

Sub-Category

: Measurement

Format

:PAPERBACK

Language

:English

Reading Level

: All

Dimension

: 8.46 X 6.34 X 1.05 inches

Weight

:513 g

About the Author

David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.

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