Secondary Ion Mass Spectrometry : Applications for Depth Profiling and Surface Characterization

Name: Secondary Ion Mass Spectrometry : Applications for Depth Profiling and Surface Characterization
Brand: Momentum Press, LLC
SKU: 1606505882
Price: 5590 INR
Availability: InStock
ISBN: 9781606505885

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15 Sep, 2015

By Fred Stevie (author)

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It...

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ISBN-10:

1606505882

ISBN-13:

9781606505885

Publisher

Momentum Press, LLC

Dimensions

9.00 X 6.00 X 0.61 inches

Language

English

Description

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

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Product Details

ISBN-10

:1606505882

ISBN-13

:9781606505885

Publisher

:Momentum Press, LLC

Publication date

: 15 Sep, 2015

About the Author

Senior Researcher, North Carolina State University

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Secondary Ion Mass Spectrometry : Applications for Depth Profiling and Surface Characterization

By Fred Stevie (author)

Description

Product Details

About the Author