Boganto Logo
Account Wishlist Cart 0
Spectroscopic Ellipsometry : Practical Application to Thin Film Characterization

Spectroscopic Ellipsometry : Practical Application to Thin Film Characterization

PAPERBACK

16 Dec, 2015

By Harland G Tompkins (author), James N Hilfiker (author)

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thi...

International Edition

Ships within 15-17 Business Days

New

₹ 4749
₹ 3544
BRAND NEW - Item in perfectly NEW condition.

Used

-
GOOD CONDITION - Used book in GOOD - READABLE condition. The books may contain markings, highlightings and wear due to previous usage. The book is in overall good condition. Great Deal !!!

Cancellation Policy

Shipping Policy

Return Policy

Last updated on 22 Feb, 2026

ISBN-10:

1606507273

ISBN-13:

9781606507278

Publisher

Momentum Press, LLC

Dimensions

9.00 X 6.00 X 0.41 inches

Language

English

Description

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Product Details

ISBN-10

:1606507273

ISBN-13

:9781606507278

Publisher

:Momentum Press, LLC

Publication date

: 16 Dec, 2015

Category

: Technology & Engineering

Sub-Category

: Materials Science - General

Format

:PAPERBACK

Language

:English

Reading Level

: All

Dimension

: 9.00 X 6.00 X 0.41 inches

Weight

:268 g

About the Author

Harland G. Tompkins received his BS in physics from the University of Missouri and his PhD in physics from the University of Wisconsin-Milwaukee. He is a consultant for the J. A. Woollam Company in Lincoln, NE, as well as for other companies. He has written numerous journal articles in the reviewed technical literature, is the author of four books, and has edited two books.

Loading, please wait...

Copyright © 2026. Boganto.com. All Rights Reserved